Properties of High-Energy X-Ray Detector With Heavy-Metal-Oxide Nanoparticle-Loaded Plastic Scintillator

Properties of High-Energy X-Ray Detector With Heavy-Metal-Oxide Nanoparticle-Loaded Plastic Scintillator
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重金属氧化物纳米颗粒负载塑料闪烁体高能 X 射线探测器的特性

DOI:
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发表时间:
2022
影响因子:
1.8
通讯作者:
A. Toda
A. Toda
中科院分区:
工程技术3区
文献类型:
--
作者:
S. Kishimoto;A. Toda

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重金属氧化物纳米粒子塑料闪烁体(PLS)是一种有效的快速探测器,用于测量高能X射线,计数率为<inline-formula><tex-math notation="LaTeX">${&gt;}10^{7}, ext{s}^{-1}$</tex-math></inline-formula>和亚纳秒时间分辨率。我们通过与作为基于荧光团的聚苯乙烯或聚乙烯基甲苯的2-(4-叔丁基苯基)-5-(4-联苯基)-1,3,4-恶二唑混合来聚合高达50重量%的Bi 2 O3纳米颗粒负载的PLS(Bi-PLS)。用高速光电倍增管(PMT)评价40重量%的Bi-PLS。脉冲高度和时间谱是使用光子工厂(PF)环的同步加速器X射线束获得的,探测器在73.04 keV。探测效率为25.4 ± 0.1%,半高宽(FWHM)为0.24 ± 0.06 ns。在PF环的多聚束模式下,在57.61keV处记录到最大计数率为<inline-formula><tex-math notation="LaTeX">3.28keV imes,,10 ^{7},, ext{s}^{-1}$</tex-math></inline-formula>,输入光子速率为1.99 <inline-formula><tex-math notation="LaTeX">$ imes,,10 ^{8},, ext{s}^{-1}$</tex-math></inline-formula>。另一个X射线检测器使用40重量%的HfO 2纳米粒子加载PLS(Hf-PLS)的Hf<inline-formula><tex-math notation="LaTeX">$K$</tex-math></inline-formula>吸收边附近的65.35千电子伏的调查<inline-formula><tex-math notation="LaTeX">$K$</tex-math></inline-formula>X射线发射的影响。从Hf-PLS发射的<inline-formula><tex-math notation="LaTeX">$K$</tex-math></inline-formula>X射线将检测效率降低到小于用光电吸收计算的值。此外,它通过增加由于<inline-formula><tex-math notation="LaTeX">$K$</tex-math></inline-formula>X射线逃逸事件的轻微峰尾影响时间谱。然而,与脉冲高度的阈值水平的一个合适的设置,检测器被证实表现出上级性能的时间谱,即使在高-<inline-formula><tex-math notation="LaTeX">$Z$</tex-math></inline-formula>原子的<inline-formula><tex-math notation="LaTeX">$K$</tex-math></inline-formula>吸收边。
A heavy-metal-oxide nanoparticle-loaded plastic scintillator (PLS) is effective for a fast detector to measure high-energy X-rays, with a count rate of <inline-formula> <tex-math notation="LaTeX">${>}10^{7},, ext{s}^{-1}$ </tex-math></inline-formula> and sub-nanosecond time resolution. We polymerized up to 50-wt% Bi2O3 nanoparticle-loaded PLS (Bi-PLS) by mixing with 2-(4-tert-butylphenyl)-5-(4-biphenyl)-1,3,4-oxadiazole as fluorophore-based polystyrene or polyvinyltoluene. A 40-wt% Bi-PLS was evaluated with a high-speed photomultiplier tube (PMT). The pulse-height and time spectra were obtained using a synchrotron X-ray beam of the photon factory (PF) ring, with the detector at 73.04 keV. The detection efficiency reached 25.4 ± 0.1% for a thickness of 3 mm, and the time resolution [full-width at half-maximum (FWHM)] was 0.24 ± 0.06 ns. The counting rates were recorded at 57.61 keV in the multibunch mode of the PF ring, with a maximum count rate of 3.28 <inline-formula> <tex-math notation="LaTeX">$ imes ,,10^{7},, ext{s}^{-1}$ </tex-math></inline-formula> at an input photon rate of 1.99 <inline-formula> <tex-math notation="LaTeX">$ imes ,,10^{8},, ext{s}^{-1}$ </tex-math></inline-formula>. Another X-ray detector using 40-wt% HfO2 nanoparticle-loaded PLS (Hf-PLS) was operated around the Hf <inline-formula> <tex-math notation="LaTeX">$K$ </tex-math></inline-formula> absorption edge of 65.35 keV to investigate the effects of <inline-formula> <tex-math notation="LaTeX">$K$ </tex-math></inline-formula> X-ray emission. The emitted <inline-formula> <tex-math notation="LaTeX">$K$ </tex-math></inline-formula> X-rays from the Hf-PLS reduced the detection efficiency to a value less than that calculated with photoelectric absorption. Furthermore, it affected the time spectrum by adding a slight peak tail due to the <inline-formula> <tex-math notation="LaTeX">$K$ </tex-math></inline-formula> X-ray escape events. However, with a suitable setting for the threshold level of the pulse height, the detector was confirmed to exhibit superior performance in the time spectrum even over the high-<inline-formula> <tex-math notation="LaTeX">$Z$ </tex-math></inline-formula> atom’s <inline-formula> <tex-math notation="LaTeX">$K$ </tex-math></inline-formula> absorption edge.
DOI: 10.48550/arxiv.1804.06708
发表时间: 2018
期刊: --
影响因子: --
作者:
Alexeev P
通讯作者: Alexeev P