Kelvin Probe Force Microscopy Imaging Using Carbon Nanotube Probe

Kelvin Probe Force Microscopy Imaging Using Carbon Nanotube Probe
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使用碳纳米管探针进行开尔文探针力显微镜成像

DOI：
10.1143/jjap.40.4314
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发表时间：
2001
期刊：
影响因子：
--
通讯作者：
Yoshikazu Nakayama Yoshikazu Nakayama
Yoshikazu Nakayama Yoshikazu Nakayama
中科院分区：
--
文献类型：
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作者：
S. Takahashi;T. Kishida;Seiji Akita Seiji Akita;Yoshikazu Nakayama Yoshikazu Nakayama

文献摘要

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我们已经测量了之间的接触电位差（CPD）的电位分布的Al蒸发基板和分散的碳纳米管（CNT）之间的开尔文探针力显微镜（KFM）使用传统的Au涂层的Si（Au-Si）探针和CNT探针。通过使用CNT探针，提高了形貌和电势分布图像的横向分辨率。已经测量了具有各种直径的CNT的CPD。我们观察到CPD随着直径的增加而增加。这表明CNT的功函数随着直径的增加而增加。
We have measured the potential profiles of the contact potential difference (CPD) between Al-evaporated substrates and dispersed carbon nanotubes (CNTs) by Kelvin probe force microscopy (KFM) using both a conventional Au-coated Si (Au–Si) probe and a CNT probe. The lateral resolutions of both topography and the potential distribution image were improved by using the CNT probe. The CPD has been measured for CNTs with various diameters. We observed that the CPD increases with an increase in the diameter. This indicates that the work function of CNTs increases with an increase in the diameter.