A new view on polarization microscopy
A new view on polarization microscopy
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DOI:
10.1038/381811a0
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发表时间:
1996-06-27
期刊:
影响因子:
64.8
通讯作者:
Oldenbourg, R
中科院分区:
文献类型:
--
作者:
Oldenbourg, R
FIG. 1 Mitotic spindle isolated from fertilized sea urchin egg and imaged with the Pol-Scope (Strongylocentrotus purpartus, preparation by John Murray, University of Pennsylvania, Philadelphia, USA). Retardance magnitude image, white: 5 nm retardance; black: 0 nm. Microtubule bundles radiate out from two black centrosomes; chromosomes visible between the two star formations (asters). tial to measure submicroscopic molecular order dynamically and nondestructively in samples that, in general, can be kept in native environmental conditions. Furthermore, specific structures, such as filaments and membranes, are highlighted owing to their intrinsic optical properties, without the need to stain or label them. With the traditional polarized light microscope, however, single images display only those anisotropic structures that have a limited range of orientations with respect to the polarization axes of the microscope. In addition, rapid measurements are restricted to a single image point or single area that exhibits uniform birefrinmicroscope with novel electro-optical devices, algorithms to compute specimen birefringences and today's digital image capture and processing capabilities. Figures 1 and 2 exhibit the exquisite resolution, high contrast and analytical strength of images taken with this new microscope. gence or other forms of optical anisotropy', while measurements comparing several image points take an inordinately long time7•Expressed in distance, the retardance magnitude is the birefringence multiplied with the pathlength through the specimen. The slow axis orientation or retardance azimuth refers to the orientation of the principal axis with the largest refractive index). The retardance is measured at all points of the image and irrespective of orientation of the birefringence axes. Raw image data are recorded in less than half a second at a resolution of 640 by 480 image points and converted to retardance magnitude and orientation values in less than one second using a desktop computer. Retardance values as low as 0.02 nm and as high as several wavelengths can be measured, at a spatial resolution of 0.2 µm or larger, depending on the lenses used. Measurements are displayed as images representing submicroscopic molecular order at an unprecedented level of clarity and detail.