SLEUTH - a fast computer program for automatically detecting particles in electron microscope images
SLEUTH - a fast computer program for automatically detecting particles in electron microscope images
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DOI：
10.1016/j.jsb.2003.09.011
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发表时间：
2004-01-01
影响因子：
3
通讯作者：
Short, JM
中科院分区：
文献类型：
--
作者：
Short, JM
已经开发出一种方法，通过使用一系列简单的标准将小窗口与一组参考图像匹配来在数字化电子显微镜中定位生物复合体。该程序从参考图像中计算出回转半径、密度和和方差等参数。它将它们与从显微照片中提取的密度的移动正方形窗口中的相应值进行比较，并记录成功匹配的候选正方形的坐标。由于在一系列重叠窗口中检测到相同的粒子，因此对被发现接近的候选进行分组，并从每个群中选择最适合的一个。用户只需要选择一小堆盒装的参考图像，并提供一些参数，例如粒子半径和粒子中心之间可接受的最小距离。显微照片标签和其他不包含适当标本的区域将被自动忽略，以便将假阳性降至最低。该程序已经在各种不同的生物结构上进行了成功的测试，无论是阴性染色的样本还是冰埋的样本。(C)2003 Elsevier Inc.保留所有权利。
A method has been developed to locate biological complexes in a digitized electron micrograph by matching small windows to a set of reference images using a series of simple criteria. From the reference images, the program calculates parameters such as the radius of gyration, the density sum and variance. It compares them with corresponding values from a moving square window of densities extracted from the micrograph and records the coordinates of successfully matched candidate squares. Since the same particle is detected in a series of overlapping windows, candidates found to be within close proximity are grouped and the best-fitting one is selected from each cluster. The user is required only to select a small stack of boxed reference images and provide a few parameters, such as the particle radius and the minimum acceptable distance between particle centres. Micrograph labels and other areas that do not contain appropriate specimens are automatically ignored in order to minimize false positives. The program has been tested successfully on a variety of different biological structures, from both negatively stained and ice-embedded specimens. (C) 2003 Elsevier Inc. All rights reserved.