176Hf/177Hf determination in small samples by a high-temperature SIMS technique
176Hf/177Hf determination in small samples by a high-temperature SIMS technique
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DOI：
10.1021/ac00095a012
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发表时间：
1994-12
影响因子：
7.4
通讯作者：
V. Salters
中科院分区：
文献类型：
--
作者：
V. Salters
本文介绍了一种分析地质样品中铪同位素组成的新方法。该技术需要从复杂的基质中分离和纯化Hf。所得Hf分离物含有小于0.2%的Zr和小于0.01%的Ti。在称为«hotSIMS»的新质谱技术中，样品在被初级光束轰击的同时保持在高温下。热二次离子质谱技术的电离效率比传统的热电离好几个数量级。此外，由于样品被保持在高温下，溅射的二次离子的质谱仅包含有限量的分子离子;特别是，高温抑制了离子的形成
This paper describes a new method for the analysis of the Hf isotopic composition in geological materials. This technique requires the separation and purification of Hf out of a complex matrix. The resulting Hf separate contains less than 0.2% Zr and less than 0.01% Ti. In the new mass spectrometric technique, called «hotSIMS», the sample is held at a high temperature while being bombarded by a primary beam. The hot-SIMS technique has several orders of magnitude better ionization efficiency than conventional thermal ionozation. Also, due to the high temperature at which the sample is held, the mass spectrum of the sputtered secondary ions contains only a limited amount of molecular ions; the formation of hydrides, especially, is inhibited by the high temperatures