Two-wavelength interferometry that uses a fourier-transform method.
Two-wavelength interferometry that uses a fourier-transform method.
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DOI：
10.1364/ao.37.007988
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发表时间：
1998-12
期刊：
影响因子：
1.9
通讯作者：
R. Onodera;Y. Ishii
中科院分区：
文献类型：
--
作者：
R. Onodera;Y. Ishii
研究了基于傅里叶变换的双波长干涉测量法。从具有两个空间载波频率的双波长干涉图中测量了合成波长处的相位轮廓。从理论上和数值上分析了由于两个波长的调制强度不同而引起的相位误差。通过对双波长干涉图进行功率谱调整，可以得到无误差的相位图。
Two-wavelength interferometry that is based on a Fourier-transform method has been investigated. A phase profile at a synthetic wavelength has been measured from a two-wavelength interferogram with two spatial carrier frequencies. A phase error caused by the difference between modulation intensities at two wavelengths has been theoretically and numerically analyzed. A phase map without the error can be obtained from a power-spectrum adjustment in the two-wavelength interferogram.