Characterization of Kα spectral profiles for vanadium, component redetermination for scandium, titanium, chromium, and manganese, and development of satellite structure for Z=21 to Z=25 -: art. no. 012508
Characterization of Kα spectral profiles for vanadium, component redetermination for scandium, titanium, chromium, and manganese, and development of satellite structure for Z=21 to Z=25 -: art. no. 012508
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DOI：
10.1103/physreva.73.012508
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发表时间：
2006-01-01
影响因子：
2.9
通讯作者：
Kimpton, JA
中科院分区：
文献类型：
--
作者：
Chantler, CT;Kinnane, MN;Kimpton, JA
在大多数高精度 X 射线实验中，特征辐射用于确定校准能量或波长。本文介绍了钒 K α 的实验结果，以及钪、钛、铬和锰的组件改装，解决了当前使用该方法的一个关键限制。定量讨论和确定了光谱仪展宽对这些校准曲线配准的影响。该分析允许进行此类校准，与参考不确定度相比，精度损失微乎其微，低至百万分之一的水平。在此过程中，我们揭示了从 Z=21 到 Z=25 的 K α 谱剖面的关键经验结构趋势，这些趋势源自详细的物理过程，而这些物理过程既没有得到很好的理解，也没有得到很好的理论评估。
In most high-accuracy x-ray experiments, characteristic radiation is used to determine calibration energies or wavelengths. This paper presents experimental results for vanadium K alpha, and component refitting for scandium, titanium, chromium, and manganese, addressing a critical limitation on the current use of this approach. The influence of spectrometer broadening upon the registration of these calibration profiles is quantitatively discussed and determined. The analysis permits such calibration with insignificant loss of accuracy compared to the reference uncertainty, down to a one part per million level. In the process we reveal key empirical structural trends in K alpha spectral profiles from Z=21 to Z=25 which originate from detailed physical processes which are neither well understood nor well evaluated theoretically.