ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction
ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction
复制标题
ATPG 启发式依赖观察点插入以增强压缩和减少数据量
DOI：
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发表时间：
2008
期刊：
影响因子：
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通讯作者：
I. Pomeranz
中科院分区：
文献类型：
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作者：
S. Remersaro;J. Rajski;Thomas Rinderknecht;S. Reddy;I. Pomeranz
随着数字电路门数的增加，制造测试所需的数据量也随之增加。为了解决这个问题，已经开发了几种测试压缩技术。本文提出了一种新颖的、可扩展的技术，通过减少模式数目和数据量来插入观测点以辅助压缩。给出的工业电路实验结果证明了该方法的有效性。
As digital circuits grow in gate count so does the data volume required for manufacturing test. To address this problem several test compression techniques have been developed. This paper presents a novel and scalable technique for inserting observation points to aid compression by reducing pattern count and data volume. Experimental results presented for industrial circuits demonstrate the effectiveness of the method.