Application of template matching technique to particle detection in electron micrographs
Application of template matching technique to particle detection in electron micrographs
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DOI：
10.1016/j.jsb.2003.11.004
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发表时间：
2004-01-01
影响因子：
3
通讯作者：
Penczek, PA
中科院分区：
文献类型：
--
作者：
Huang, Z;Penczek, PA
与电子显微镜中图像形成的综合理论匹配的模板提供了一种最佳的（在贝叶斯意义上），用于求解单个粒子分析中的一个杰出问题之一，即从噪声显微图像中自动选择粒子视图。该方法基于以下假设：参考三维结构是已知的，并且可以估算图像形成过程模型的相关参数。在过程的第一阶段，使用可用的参考结构生成一组可能的粒子视图。模板图像使用聚类技术构造为可用粒子视图的线性组合。接下来，使用自动对比度传输函数（CTF）估计程序建立显微照片噪声特性。最后，计算出的CTF参数用于构建匹配的过滤器，并计算与可用模板图像相对应的相关函数。为了减轻图像形成条件的偏见问题，提出了基于相关系数的预测分布的决策策略。证明，由于包含CTF考虑因素，模板匹配方法在广泛的显微镜条件下表现出色。 （c）2003 Elsevier Inc.保留所有权利。
Template matching together with the comprehensive theory of image formation in electron microscope provides an optimal (in Bayesian sense) tool for solving one of the outstanding problems in single particle analysis, i.e., automatic selection of particle views from noisy micrograph fields. The method is based on the assumption that the reference three-dimensional structure is known and that the relevant parameters of the model of the image formation process can be estimated. In the first stage of the procedure, a set of possible particle views is generated using the available reference structure. The template images are constructed as linear combinations of available particle views using a clustering technique. Next, the micrograph noise characteristic is established using an automated contrast transfer function (CTF) estimation procedure. Finally, the CTF parameters calculated are used to construct a matched filter and correlation functions corresponding to the available template images are calculated. In order to alleviate the problem of the biased caused by varying image formation conditions, a decision making strategy based on the predicted distribution of correlation coefficients is proposed. It is demonstrated that due to the inclusion of CTF considerations, the template matching method performed very well in a broad range of microscopy conditions. (C) 2003 Elsevier Inc. All rights reserved.