X-ray fluorescence analysis of major and trace elements in silicate rocks using 1:5 dilution glass beads
X-ray fluorescence analysis of major and trace elements in silicate rocks using 1:5 dilution glass beads
复制标题
DOI：
--
复制
发表时间：
2005
期刊：
影响因子：
--
通讯作者：
Y. Mori;H. Mashima
中科院分区：
文献类型：
--
作者：
Y. Mori;H. Mashima
本文介绍了用x射线荧光光谱法测定硅酸盐岩石中主要元素和微量元素的方法。分析的元素有SiOz、Ti02、A1203、总Fe203、MnO、MgO、CaO、Na20、K20、p2o、Sc、V、Cr、Ni、Cu、Zn、Rb、Sr、Y、Zr、Nb、Ba、La、Ce、Nd和Pb。所有这些元素都是在由1g样品粉末，5g Li2B407助焊剂和约50mg Lil释放剂的混合物制成的单个玻璃珠上测定的。用纯化学试剂制备了一系列合成标准样品，用于标定XRF光谱仪。使用基本参数方法的矩阵和线重叠校正产生可靠的校准线，具有广泛的最佳组成范围。GSJ地球化学参考样品的分析结果与推荐值吻合较好，对主要元素和微量元素均具有足够的精度和灵敏度。
Thisreport describes analytical techniques for major and trace elements in silicate rocks by X-ray fluorescence (XRF) spectrometry. The analyzed elements are SiOz, Ti02, A1203, total Fe203, MnO, MgO, CaO, Na20, K20, P2Os, Sc, V, Cr, Ni, Cu, Zn, Rb, Sr, Y, Zr, Nb, Ba, La, Ce, Nd and Pb. All of these elements were determined on a single glass bead made from mixtures of 1 g of sample powder, 5 g of Li2B407 flux and about 50 mg of Lil releasing agent. A series of synthetic standard samples were prepared from pure chemical reagents to calibrate an XRF spectrometer. Matrix and line overlap corrections using a fundamental parameter approach yields reliable calibration lines with wide optimal ranges of composition. Analytical results of GSJ geochemical reference samples are in good agreement with their recommended values and exhibit sufficient precision and sensitivity for both major and trace elements.