Thermoelectric performance of layered SrxTiSe2 above 300 K
Thermoelectric performance of layered SrxTiSe2 above 300 K
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DOI:
10.1088/0953-8984/26/44/445002
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发表时间:
2014-11-05
影响因子:
2.7
通讯作者:
Gupta, S. K.
中科院分区:
文献类型:
--
作者:
Bhatt, Ranu;Patel, Miral;Gupta, S. K.
In this paper we report the thermoelectric performance of Sr intercalated TiSe2 above 300 K. Refined x-ray diffraction, high resolution transmission electron microscopy and scanning electron microscopy images show well oriented polycrystalline grains along a (0 0 l) direction and layered growth of the sample. Intercalation of Sr in TiSe2 shows an improved Seebeck coefficient (alpha) value without altering the polarity of the majority charge carrier. A drastic reduction in the thermal conductivity (kappa) from 3.8 W m K-1 to 1.2 W m K-1 (at 650 K) was observed which is ascribed to the: (i) scattering of the phonon by natural layer interfaces, grain boundaries and lattice defects and (ii) rattling of intercalated Sr atoms among weakly bound TiSe2 layers. This led to the maximum ZT of similar to 0.08 at 650 K for SrxTiSe2 (x > 0.1) which is almost twice as high as the parent TiSe2.