High temperature experiments using programmable transistor array
High temperature experiments using programmable transistor array
复制标题
使用可编程晶体管阵列的高温实验
DOI：
10.1109/aero.2004.1368038
复制
发表时间：
2004
期刊：
影响因子：
--
通讯作者：
A. Stoica
中科院分区：
文献类型：
--
作者：
R. Zebulum;Xin Guo;D. Keymeulen;M. I. Ferguson;V. Duong;A. Stoica
耐高温、耐辐射的电子设备以及长寿命的生存能力是未来 NASA 任务所需的关键能力。目前针对极端环境的电子产品的方法侧重于组件级的鲁棒性和强化。还采用了诸如偏置消除电路之类的补偿技术。然而，目前的技术只能确保在极端环境下的使用寿命非常有限。本文提出了一种基于可进化硬件技术的新颖方法，该方法允许在极端环境下运行期间进行自适应原位电路重新设计/重新配置。该技术补充了材料/设备的进步，并提高了在恶劣环境中生存的任务能力。该方法在混合信号可编程芯片上进行了演示，该芯片在 280/spl deg/C 之前恢复功能。我们在本文中展示了各种电路（包括整流器、放大器和滤波器）在高温下的功能恢复。
Temperature and radiation tolerant electronics, as well as long life survivability are the key capabilities required for future NASA missions. Current approaches to electronics for extreme environments focus on component level robustness and hardening. Compensation techniques such as bias cancellation circuitry have also been employed. However, current technology can only ensure very limited lifetime in extreme environments. This paper presents a novel approach, based on evolvable hardware technology, which allows adaptive in-situ circuit redesign/reconfiguration during operation in extreme environments. This technology complements material/device advancements and increases the mission capability to survive harsh environments. The approach is demonstrated on a mixed-signal programmable chip, which recovers functionality until 280/spl deg/C. We show in this paper the functionality recovery at high temperatures for a variety of circuits, including rectifiers, amplifiers and filters.