A development of lifetime measurement based on the differential decay curve method
A development of lifetime measurement based on the differential decay curve method
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基于微分衰减曲线法的寿命测量研究进展
DOI：
10.1007/s41365-018-0453-6
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发表时间：
2018
影响因子：
2.8
通讯作者：
Sun Ji
中科院分区：
文献类型：
--
作者：
Zhong Jian;Wu Xiao Guang;Ma Ying Jun;Zheng Yun;Li Cong Bo;Li Guang Sheng;Zhu Bao Ji;Li Tian Xiao;Jin Yan Jun;Gao Yan Xiang;Ma Ke Yan;Yang Dong;Guo Hao;Wang Jia Qi;Guan Xian;Sun Ji
本文介绍了微分衰减曲线法寿命测量中间接门控法的新进展。门区从部分位移峰扩展到位移和未位移分量。门控光谱中的飞行峰和停止峰的统计特性得到明显改善。这种变化的可靠性已通过重新分析状态的寿命进行了测试。32.2（33）ps的结果与以前发表的值在实验不确定度范围内吻合得很好。用所提出的方法分析了中的态寿命.
A new development of indirect gating case in the differential decay curve method used for lifetime measurement has been introduced. The gate region was extended from partial shifted peak to both shifted and unshifted components. The statistics of flight and stop peaks in gating spectra was improved obviously. The reliability of this change has been tested by reanalysing the lifetime ofstate in. The result of 32.2(33) ps was fit well with the previous published values within the experimental uncertainty. The developed method was also used to analyse the lifetime ofstate in.