Quantitative Measurement of Linear Dielectric Constant Using Scanning Nonlinear Dielectric Microscopy with Electro-Conductive Cantilever
Quantitative Measurement of Linear Dielectric Constant Using Scanning Nonlinear Dielectric Microscopy with Electro-Conductive Cantilever
复制标题
使用导电悬臂扫描非线性介电显微镜定量测量线性介电常数
DOI:
10.1143/jjap.41.4961
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发表时间:
2002
影响因子:
1.5
通讯作者:
Yasuo Cho
中科院分区:
文献类型:
--
作者:
K. Ohara;Yasuo Cho
A quantitative measurement method of the linear dielectric constant using cantilever-type scanning nonlinear dielectric microscopy (SNDM) is reported. Using this method, we succeed in quantitatively measuring the linear dielectric constant distribution of TiO2–Bi2Ti4O11 ceramics with higher resolution than that obtained with needle-type SNDM.