Generic Self Repair Architecture with On-Line Fault Diagnosis

Generic Self Repair Architecture with On-Line Fault Diagnosis
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具有在线故障诊断功能的通用自修复架构

DOI:
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发表时间:
2015
期刊:
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
影响因子:
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通讯作者:
M. Fischerová
M. Fischerová
中科院分区:
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文献类型:
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作者:
Stefan Kristofík;M. Baláz;M. Fischerová

文献摘要

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越来越小的纳米技术引入了新类型的缺陷和故障机制,对片上系统(SoC)的可靠性和使用寿命产生了负面影响。本文提出了一种故障诊断和修复过程,并实现到通用的内置自修复架构。该程序利用在线故障检测,而修复过程中进行离线模式。实验结果表明,该方法修复速度快,面积开销远低于三模冗余系统的额外面积。
Ever smaller nanotechnologies introduce new types of defects and fault mechanisms with negative influence on system on-chips (SoCs) reliability and operational life. This paper presents a fault diagnosis and repair procedure which is implemented into generic built-in self-repair architecture. The procedure utilizes on-line fault detection whereas repair is performed during off-line mode. Experimental results show quicker repair process and area overhead which is well below the additional area of triple modular redundancy system.