Infrared optical properties of SrBi2Ta2O9 ferroelectric thin films
Infrared optical properties of SrBi2Ta2O9 ferroelectric thin films
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DOI：
10.1063/1.370963
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发表时间：
1999-07
影响因子：
3.2
通讯作者：
Zhiming Huang;P. Yang;Yong Chang;J. Chu
中科院分区：
文献类型：
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作者：
Zhiming Huang;P. Yang;Yong Chang;J. Chu
用椭圆偏振红外光谱法测量了钽酸锶铋（SBT）铁电薄膜的红外光学常数（2.5-12.5 μm）。通过用三相模型（Air/SBT/Pt）拟合实验的赝介电常数ε 1 ε和ε 2 ε，获得了薄膜的光学常数和厚度，并获得了薄膜在802 cm-1处的本征振动频率。对振动频率的可能贡献进行了讨论。
Infrared optical constants of strontium bismuth tantalate (SBT) ferroelectric thin films have been derived from infrared spectroscopic ellipsometric measurements (2.5–12.5 μm). By fitting the experimental pseudodielectric constants 〈e1〉 and 〈e2〉 with a three-phase model (Air/SBT/Pt), the optical constants and thickness of the films have been obtained, and an intrinsic vibrational frequency of the films at 802 cm−1 has also been acquired. The possible contribution to the vibrational frequency has been discussed.