The dedicated high-resolution grazing-incidence X-ray scattering beamline 8-ID-E at the Advanced Photon Source
The dedicated high-resolution grazing-incidence X-ray scattering beamline 8-ID-E at the Advanced Photon Source
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DOI：
10.1107/s0909049512022017
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发表时间：
2012-07-01
影响因子：
2.5
通讯作者：
Wang, Jin
中科院分区：
文献类型：
--
作者：
Jiang, Zhang;Li, Xuefa;Wang, Jin
掠入射x射线散射（GIXS）作为一种越来越重要的结构表征技术，在纳米结构和纳米复合材料表面和界面的原位和实时研究中得到了广泛的应用。在先进光子源的8-ID-E光束线上设计、构建和优化了一条专用的光束线，用于高分辨率和相干的GIXS实验。通过反射率、掠入射静态和动态散射以及相干表面x射线光子相关光谱等一系列实验，证明了光束线和散射技术的有效性和适用性。可以在8-ID-E研究的适用系统包括液体表面和纳米结构薄膜。
As an increasingly important structural-characterization technique, grazing-incidence X-ray scattering (GIXS) has found wide applications for in situ and real-time studies of nanostructures and nanocomposites at surfaces and interfaces. A dedicated beamline has been designed, constructed and optimized at beamline 8-ID-E at the Advanced Photon Source for high-resolution and coherent GIXS experiments. The effectiveness and applicability of the beamline and the scattering techniques have been demonstrated by a host of experiments including reflectivity, grazing-incidence static and kinetic scattering, and coherent surface X-ray photon correlation spectroscopy. The applicable systems that can be studied at 8-ID-E include liquid surfaces and nanostructured thin films.