Jointly super-resolved and optically sectioned Bayesian reconstruction method for structured illumination microscopy
Jointly super-resolved and optically sectioned Bayesian reconstruction method for structured illumination microscopy
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DOI：
10.1364/oe.27.033251
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发表时间：
2019-11-11
期刊：
影响因子：
3.8
通讯作者：
Meimon, Serge
中科院分区：
文献类型：
--
作者：
Lai-Tim, Yann;Mugnier, Laurent M.;Meimon, Serge
结构照明显微镜(SIM)是一种在广场显微镜中同时实现超分辨率(SR)和光学切片(OS)的成像技术。它包括在不同的方向和位置用周期性图案照明样品。然后，利用SR和/或OS处理所得到的图像以重建观察到的对象。在这项工作中，我们提出了一种通用的SIM重建方法，适用于活体视网膜成像中遇到的运动对象，使SR和OS能够在完全无监督的贝叶斯框架下联合进行重建。通过对一个由聚焦层和散焦层组成的两层物体的建模，我们证明了BOSSA-SIM能够联合重建这两个层，从而得到超分辨和光学切片的聚焦层。通过对几个噪声级别的模拟进行定量评估，所获得的性能与最先进的方法相比是有利的。最后，我们在开放访问的实验显微镜数据上验证了我们的方法。(C)OSA开放获取出版协议条款下的2019年美国光学学会
Structured Illumination Microscopy (SIM) is an imaging technique for achieving both super-resolution (SR) and optical sectioning (OS) in wide-field microscopy. It consists in illuminating the sample with periodic patterns at different orientations and positions. The resulting images are then processed to reconstruct the observed object with SR and/or OS. In this work, we present BOSSA-SIM, a general-purpose SIM reconstruction method, applicable to moving objects such as encountered in in vivo retinal imaging, that enables SR and OS jointly in a fully unsupervised Bayesian framework. By modeling a 2-layer object composed of an in-focus layer and a defocused layer, we show that BOSSA-SIM is able to jointly reconstruct them so as to get a super-resolved and optically sectioned in-focus layer. The achieved performance, assessed quantitatively by simulations for several noise levels, compares favorably with a state-of-the-art method. Finally, we validate our method on open-access experimental microscopy data. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement