Structural Channels and Atomic-Cluster Insertion in CsxBi4Te6 (1 ≤ x ≤ 1.25) As Observed by Aberration-Corrected Scanning Transmission Electron Microscopy
Structural Channels and Atomic-Cluster Insertion in CsxBi4Te6 (1 ≤ x ≤ 1.25) As Observed by Aberration-Corrected Scanning Transmission Electron Microscopy
复制标题
通过像差校正扫描透射电子显微镜观察到 CsxBi4Te6 (1 ≤ x ≤ 1.25) 中的结构通道和原子团插入
作者：
Ruixin Zhang;Huaixin Yang;Cong Guo;Huanfang Tian;Honglong Shi;Genfu Chen;Jianqi Li
