A conical slit for three-dimensional XRD mapping.
A conical slit for three-dimensional XRD mapping.
复制标题
用于三维 XRD 绘图的锥形狭缝。
DOI：
10.1107/s0909049500000625
复制
发表时间：
2000
影响因子：
2.5
通讯作者：
R. A. Owen
中科院分区：
文献类型：
--
作者：
S. F. Nielsen;A. Wolf;H. Poulsen;M. Ohler;U. Lienert;R. A. Owen
传统上，衍射实验中的深度分辨率是通过在入射光束和衍射光束中同时插入针孔来获得的。对于局部应变和纹理特性的材料科学研究，这会导致非常缓慢的数据采集速率，特别是在单个晶粒的水平上进行表征时。为解决这一问题，采用线材电火花加工制造了一个锥形狭缝。锥形狭缝有6个25微米厚的锥形开口，与面心立方粉末中的6个德拜-谢勒锥相匹配。通过将狭缝与微聚焦的硬x射线光束相结合，定义了嵌入的测量体积。使用二维探测器，可以快速和完整地获得有关该特定规格体积内材料的纹理和应变特性的信息。圆锥狭缝的平均加工误差和装配误差均在5微米左右。建立了一种狭缝对准算法，并以4.5 mm厚Cu样品的晶粒定位为例说明了该技术的潜力。
Traditionally, depth resolution in diffraction experiments is obtained by inserting pinholes in both the incoming and diffracted beam. For materials science investigations of local strain and texture properties this leads to very slow data-acquisition rates, especially when characterization is performed on the level of the individual grains. To circumvent this problem a conical slit has been manufactured by wire-electrodischarge machining. The conical slit has six 25 microm-thick conically shaped openings matching six of the Debye-Scherrer cones from a face-centred-cubic powder. By combining the slit with a microfocused incoming beam of hard X-rays, an embedded gauge volume is defined. Using a two-dimensional detector, fast and complete information can be obtained regarding the texture and strain properties of the material within this particular gauge volume. The average machining and assemblage errors of the conical slit are found both to be of the order of 5 microm. An algorithm for alignment of the slit is established, and the potential of the technique is illustrated with an example of grain mapping in a 4.5 mm-thick Cu sample.