Structural and electric properties of AgGaTe2 layers prepared using mixed Source of Ag2Te and Ga2Te3
Structural and electric properties of AgGaTe2 layers prepared using mixed Source of Ag2Te and Ga2Te3
复制标题
使用 Ag2Te 和 Ga2Te3 混合源制备的 AgGaTe2 层的结构和电性能
DOI:
10.1002/pssa.201600284
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发表时间:
2017
期刊:
影响因子:
--
通讯作者:
and M. Kobayashi
中科院分区:
文献类型:
--
作者:
A. Uruno;and M. Kobayashi
AgGaTe2layers were prepared on Si substrates by a closed space sublimation method using a mixed powder source of Ag2Te and Ga2Te3. Ag2Te buffer layer deposition was introduced to eliminate melt‐back etching. The effect of the molar ratio of Ag2Te and Ga2Te3in the mixed source on the crystallinity of the AgGaTe2layer was investigated. The composition and the phase of the layer was found to change depending on the molar ratio in the deposits, which could be controlled by the source molar ratio along with the Ag2Te buffer layer thickness. It was confirmed that (112) oriented uniform AgGaTe2layer with an abrupt interface between AgGaTe2and Si was formed after those parameters were tuned. The obtained layer exhibited the acceptor concentration of around 2.5 × 1016cm−3. A solar cell was fabricated using the p‐AgGaTe2/n‐Si heterojunction, and exhibited a conversion efficiency of 1.15%.