Electron impact multiple ionization of neon, argon and xenon atoms close to threshold: appearance energies and Wannier exponents
Electron impact multiple ionization of neon, argon and xenon atoms close to threshold: appearance energies and Wannier exponents
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电子撞击氖、氩和氙原子接近阈值的多重电离：表观能量和 Wannier 指数
DOI：
10.1088/0953-4075/35/13/312
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发表时间：
2002
期刊：
影响因子：
--
通讯作者：
T. Märk
中科院分区：
文献类型：
--
作者：
B. Gstir;S. Denifl;G. Hanel;M. Rümmele;T. Fiegele;P. Cicman;M. Staňo;Š. Matejčík;P. Scheier;K. Becker;A. Stamatović;T. Märk
我们报告了电子撞击 Ne、Ar 和 Xe 原子后，使用专用的高分辨率电子碰撞电离质谱仪实验测定形成多电荷 Ne、Ar 和 Xe 离子（高达 n = 4 (Ne)、n = 6 (Ar) 和 n = 8 (Xe)）的外观能量值 AE(Xn + /X) 的结果。数据分析使用 Marquart-Levenberg 算法，该算法是一种迭代、非线性最小二乘拟合例程，与基于幂阈值定律的二函数或三函数拟合相结合。这使我们能够从测量的近阈值数据中提取 Wannier 型幂律的相关 AE 和相应的指数。将本工作中确定的 AE 值与其他可用的 AE 实验值和光谱值进行比较，并将提取的指数与其他可用的实验数据以及各种 Wannier 型幂律模型的预测进行比较。
We report the results of the experimental determination of the appearance energy values AE(Xn + /X) for the formation of multiply charged Ne, Ar and Xe ions up to n = 4 (Ne), n = 6 (Ar) and n = 8 (Xe) following electron impact on Ne, Ar and Xe atoms using a dedicated high-resolution electron impact ionization mass spectrometer. The data analysis uses the Marquart-Levenberg algorithm, which is an iterative, nonlinear least-squares-fitting routine, in conjunction with either a two-function or a three-function fit based on a power threshold law. This allows us to extract the relevant AEs and corresponding exponents for a Wannier-type power law from the measured near-threshold data. The values of the AEs determined in this work are compared with other available experimental and spectroscopic values of the AEs and the extracted exponents are compared with other available experimental data and with the predictions of the various Wannier-type power law models.