Load line analysis of Bi-2223 tape-stacked-cable for self field effects
Load line analysis of Bi-2223 tape-stacked-cable for self field effects
复制标题
Bi-2223 带堆叠电缆的自场效应负载线分析
DOI：
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发表时间：
2000
影响因子：
1.8
通讯作者：
K. Ryu
中科院分区：
文献类型：
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作者：
W. Nah;Hoon Hwangbo;J. Ye;J. Joo;H. Jang;H. Ha;Sang;Young;M. Sohn;K. Ryu
一般来说，一根Bi2223叠带电缆的临界电流远小于每根磁带的临界电流的总和，这主要是由于电缆本身的自磁场所致。因此，为了预测Bi2223带式叠层电缆的临界电流，我们需要分析叠层电缆的自场效应以及单带的临界电流密度数据(J/subc/)。更复杂的是，Bi2223带材的临界电流退化是各向异性的；在法向磁场(到磁带表面)下的临界电流比在平行场中的低。本文提出了一种由单带的J/C/-B曲线来预测Bi2223叠层电缆临界电流的新方法。该方法基本包括对堆叠磁带的载荷线分析，并通过实验数据验证了该方法的有效性。
In general, the critical current of a Bi-2223 tape-stacked-cable is much less than the total summation of critical currents of each tape, which is mainly due to the self magnetic fields of the cable itself. Therefore, to predict the critical current of a Bi-2223 tape-stacked-cable, we need to analyze the self field effects of the stacked cable as well as the critical current density data (J/sub c/) of one tape. To make it more complex, the critical current degradation of a Bi-2223 tape is anisotropic; the critical current is lower in the normal magnetic field (to the tape surface) than in the parallel field. In this paper, a novel approach to predict the critical current of a Bi-2223 tape-stacked-cable from a J/sub c/-B curve of one tape is presented. The approach basically includes the load line analysis of the stacked tapes, and its usefulness is confirmed by the experimental data.