Two-dimensional measurement of edge impurity emissions using space-resolved extreme ultraviolet spectrometer in Large Helical Device.
Two-dimensional measurement of edge impurity emissions using space-resolved extreme ultraviolet spectrometer in Large Helical Device.
复制标题
DOI：
10.1063/1.4705290
复制
发表时间：
2012-04
期刊：
影响因子：
--
通讯作者：
E. Wang;S. Morita;M. Goto;C. Dong
中科院分区：
文献类型：
--
作者：
E. Wang;S. Morita;M. Goto;C. Dong
研制了一种空间分辨极紫外（EUV）光谱仪，工作波长范围为50 ~ 500 Å，用于测量大型螺旋装置（LHD）边缘等离子体发射的杂质谱线的二维分布，其中磁场由具有遍历层三维结构的随机磁场形成。通过对空间分辨EUV光谱仪单次LHD放电时的观测弦线进行水平扫描，实现了边缘杂质线发射的二维测量。CIV （312.4 Å）和HeII （303.78 Å）的图像作为第一个结果呈现。结果与LHD等离子体遍历层边缘弦长计算结果进行了比较。
A space-resolved extreme ultraviolet (EUV) spectrometer working in wavelength range of 50-500 Å has been developed to measure two-dimensional distribution of impurity spectral lines emitted from edge plasma of Large Helical Device (LHD), in which the magnetic field is formed by stochastic magnetic field with three-dimensional structure called ergodic layer. The two-dimensional measurement of edge impurity line emissions is carried out by scanning horizontally the observation chord of the space-resolved EUV spectrometer during single LHD discharge. Images of CIV (312.4 Å) and HeII (303.78 Å) are presented as the first result. The results are compared with ones calculated from the edge chord length in the ergodic layer of LHD plasma.