Non-Destructive Probing of Charge Carrier Transport in Electronic Conductive Molecular Materials and Their Interfaces

Non-Destructive Probing of Charge Carrier Transport in Electronic Conductive Molecular Materials and Their Interfaces
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电子导电分子材料及其界面中载流子传输的无损探测

DOI:
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发表时间:
2014
期刊:
影响因子:
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通讯作者:
Shu Seki
Shu Seki
中科院分区:
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文献类型:
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作者:
筒井 祐介;崔 旭鎮;櫻井 庸明;佐伯 昭紀;関 修平;崔 旭鎮;Shu Seki

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