Measurement of the life-times distribution of 216Po
Measurement of the life-times distribution of 216Po
复制标题
216Po寿命分布的测量
DOI：
10.1016/j.nima.2017.06.055
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发表时间：
2017
期刊：
影响因子：
--
通讯作者：
D. Manić
中科院分区：
文献类型：
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作者：
Laslo J. Nađđerđ;K. Subotić;Y. Tsyganov;J. Puzović;A. Polyakov;A. V. Rykhlyuk;D. Manić
α发射器216 Po的寿命分布测量已经用半导体探测器进行。我们应用了一种新方法来获取 216 Po 衰减相关信号之间的时间间隔分布。推导的 216 Po 半衰期为 144.0 (6) ms，支持早期发布的测量结果，并且不确定性远低于任何其他先前报告的值。
The life time distribution measurements of the alpha emitter 216 Po have been performed with semiconductor detectors. We applied a new method to obtain the distribution of time intervals between the correlated signals of decay of the 216 Po. The deduced half-life of 216 Po was found to be 144.0 (6) ms, supporting the earlier published measurements and with an uncertainty much lower than any other previously reported value.