Reset and partition noise in active pixel image sensors
Reset and partition noise in active pixel image sensors
复制标题
重置和分割有源像素图像传感器中的噪声
DOI:
10.1109/ted.2005.856192
复制
发表时间:
2005
影响因子:
3.1
通讯作者:
A. Nathan
中科院分区:
文献类型:
--
作者:
J. Lai;A. Nathan
Partition noise appears in conjunction with reset noise at the integration node of active pixel sensor architectures. This brief presents the modeling and measurement of partition noise based on an improved technique for charge profile estimation in the transistor channel at any given time instant. Transistor turn off transients are integrated into the model by taking into account both drift and diffusion components of current. Using the predictions of charge profile, partition noise generated during the transistor reset operation is accurately determined and verified with measured data.