Reset and partition noise in active pixel image sensors

Reset and partition noise in active pixel image sensors
复制标题

重置和分割有源像素图像传感器中的噪声

DOI:
10.1109/ted.2005.856192
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发表时间:
2005
影响因子:
3.1
通讯作者:
A. Nathan
A. Nathan
中科院分区:
工程技术2区
文献类型:
--
作者:
J. Lai;A. Nathan

文献摘要

被引文献

相似文献

在有源像素传感器架构的积分节点处,分区噪声与复位噪声一起出现。这简要介绍了建模和测量的基础上,在任何给定的时刻在晶体管沟道的电荷分布估计的改进技术的分区噪声。晶体管关断瞬态被集成到模型中,同时考虑到漂移和扩散分量的电流。利用电荷分布的预测,在晶体管复位操作过程中产生的分区噪声被准确地确定,并与测量数据进行验证。
Partition noise appears in conjunction with reset noise at the integration node of active pixel sensor architectures. This brief presents the modeling and measurement of partition noise based on an improved technique for charge profile estimation in the transistor channel at any given time instant. Transistor turn off transients are integrated into the model by taking into account both drift and diffusion components of current. Using the predictions of charge profile, partition noise generated during the transistor reset operation is accurately determined and verified with measured data.