Clustering of behavioral phases in FSMs and its applications to VLSI test
Clustering of behavioral phases in FSMs and its applications to VLSI test
复制标题
FSM 行为阶段聚类及其在 VLSI 测试中的应用
DOI：
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发表时间：
2002
期刊：
影响因子：
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通讯作者：
Zhongcheng Li
中科院分区：
文献类型：
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作者：
Huawei Li;Y. Min;Zhongcheng Li
本文提出了一种新的描述层次之间的行为和状态描述的有限状态机（FSM）。这种描述被称为行为阶段聚类描述。在有限状态机中引入了行为阶段和行为阶段聚类的新概念。新的描述简化了FSM设计的功能分析、验证和测试。如果在低级别描述有限状态机，则某些状态可以直接聚集到行为阶段。如果在行为级进行描述，则可以从行为描述中提取行为阶段，并且可以通过简单的功能分析来执行行为阶段的聚类。作为行为阶段聚类描述的一个应用，本文介绍了一种基于行为阶段故障模型的测试生成系统ATCLUB在寄存器传输（RT）级的新技术。在ATCLUB中，通过行为阶段的聚类加速了测试生成过程。实验结果表明，ATCLUB生成测试序列的效率高，与其他ATPG工具相比，在故障覆盖率略有下降的代价下，向量数急剧减少。
This paper presents a new level of description between behavioral and state descriptions of a finite-state machine (FSM). The description is termed behavioral phase clustering description. New concepts of behavioral phase and clustering of behavioral phases in an FSM are introduced. The new description simplifies functional analysis, verification and test of FSM designs. If an FSM is described at low level, some states can be clustered into behavioral phases directly. If it is described at behavioral level, behavioral phases can be extracted from the behavioral description, and clustering of behavioral phases can be performed through easy functional analysis. As one application of behavioral phase clustering descriptions, a new technique employed in a test generation system, ATCLUB, at Register Transfer (RT)-level based on a behavioral phase transition fault model is introduced in this paper. In ATCLUB, test generation process is accelerated through clustering of behavioral phases. Experimental results show that ATCLUB generates test sequence efficiently, with a sharp decrease in vector count at the penalty of a slightly decrease in fault coverage comparing to other ATPG tools.