Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50 mm
Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50 mm
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DOI：
10.1016/j.apradiso.2011.11.033
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发表时间：
2012-07-01
影响因子：
1.6
通讯作者：
Mellor, Matthew
中科院分区：
文献类型：
--
作者：
Adams, Jamie C.;Joyce, Malcolm J.;Mellor, Matthew
一个幻影已被用来定位两个辐射源，分别，当埋在干硅砂在5和50毫米之间的深度。然后测量伽马射线能谱在每1毫米的深度。进行了主成分分析，从而建立了非线性拟合，从而可以准确推断夹带深度。该技术已扩展到其他屏蔽介质：水、骨料和湿土和干土。该技术也已扩展到超过以前的深度限制50毫米。（C）2011爱思唯尔有限公司保留所有权利。
A phantom has been used to position two radiation sources, separately, when buried under dry-silica sand at depths between 5 and 50 mm. A gamma-ray energy spectrum was then measured at every 1 mm depth. Principal component analysis has been conducted, which has led to a non-linear fit being established, allowing the depth of entrainment to be accurately inferred. The technique has been expanded for additional shielding media: water, aggregate and both wet and dry soil. The technique has also been expanded beyond the previous depth constraint of 50 mm. (C) 2011 Elsevier Ltd. All rights reserved.