Influence of Isoelectronic Te Doping on the Physical Properties of ZnO Films Grown by Molecular-Beam Epitaxy

Influence of Isoelectronic Te Doping on the Physical Properties of ZnO Films Grown by Molecular-Beam Epitaxy
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等电子Te掺杂对分子束外延ZnO薄膜物理性能的影响

DOI:
10.7567/jjap.52.055501
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发表时间:
2013
期刊:
J. J. Appl. Phys.
影响因子:
--
通讯作者:
T. Taishi and I. Yonenaga
T. Taishi and I. Yonenaga
中科院分区:
--
文献类型:
--
作者:
S-H. Park;T. Minegishi;D-C. Oh;D-J. Kim;J-H. Chang;T. Yao;T. Taishi and I. Yonenaga

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