Reset noise suppression in two-dimensional CMOS photodiode pixels through column-based feedback-reset

Reset noise suppression in two-dimensional CMOS photodiode pixels through column-based feedback-reset
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通过基于列的反馈复位来抑制二维 CMOS 光电二极管像素中的复位噪声

DOI:
10.1109/iedm.2002.1175961
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发表时间:
2002
期刊:
Digest. International Electron Devices Meeting,
影响因子:
--
通讯作者:
M. Ortiz
M. Ortiz
中科院分区:
--
文献类型:
--
作者:
B. Pain;T. Cunningham;B. Hancock;G. Yang;S. Seshadri;M. Ortiz

文献摘要

被引文献

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我们推出了一种新型 CMOS 光电二极管成像器像素,通过基于列的反馈电路对复位噪声进行片上抑制,从而具有超低读取噪声。在0.5/spl mu/m CMOS工艺中,像素仅占据10/spl次/10/spl mu/m/sup 2/面积。来自 256/sup 2/ CMOS 成像器的数据表明成像器操作时读取噪声低至 6 个电子,而无需采用片上或片外相关双采样。在不引入任何图像滞后的情况下实现了噪声降低,并且量子效率和满阱的降低微不足道。
We present a new CMOS photodiode imager pixel with ultralow read noise through on-chip suppression of reset noise via column-based feedback circuitry. In a 0.5 /spl mu/m CMOS process, the pixel occupies only 10/spl times/10 /spl mu/m/sup 2/ area. Data from a 256/sup 2/ CMOS imager indicates imager operation with read noise as low as 6 electrons without employing on- or off-chip correlated double sampling. The noise reduction is achieved without introducing any image lag, and with insignificant reduction in quantum efficiency and full-well.