Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background
Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background
复制标题
使用切伦科夫探测器测量散射背景中 X 射线的厚度
DOI：
10.1088/1674-1137/34/12/020
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发表时间：
2010
影响因子：
3.6
通讯作者：
Zhang Qing-Jun
中科院分区：
文献类型：
--
作者：
Li Shu-Wei;Kang Ke-Jun;Wang Yi;Li Jin;Li Yuan-Jing;Zhang Qing-Jun
环境散射背景的变化是x射线检测测量系统中系统误差的主要来源。由于这些由环境散射背景组成的光子的能量通常要低得多，因此具有探测阈值的切伦科夫探测器可能对它们不敏感，能够排除它们的影响。设计了一个厚度测量实验，通过使用切伦科夫探测器和电离室进行比较来验证这一想法。此外，还发现切伦科夫探测器的应用有助于排除光谱中低能分量在探测器体积上的变化所带来的另一种系统误差。
The variation in environmental scattering background is a major source of systematic errors in X-ray inspection and measurement systems. As the energy of these photons consisting of environmental scattering background is much lower generally, the Cerenkov detectors having the detection threshold are likely insensitive to them and able to exclude their influence. A thickness measurement experiment is designed to verify the idea by employing a Cerenkov detector and an ionizing chamber for comparison. Furthermore, it is also found that the application of the Cerenkov detectors is helpful to exclude another systematic error from the variation of low energy components in the spectrum incident on the detector volume.