Equally sloped tomography based X-ray full-field nano-CT at Shanghai Synchrotron Radiation Facility
Equally sloped tomography based X-ray full-field nano-CT at Shanghai Synchrotron Radiation Facility
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DOI：
10.1016/j.nima.2018.04.024
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发表时间：
2018-07
期刊：
影响因子：
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通讯作者：
Y. F. Wang;Yuqi Ren;G. Zhou;G. Du;Honglan Xie;B. Deng;T. Xiao
中科院分区：
文献类型：
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作者：
Y. F. Wang;Yuqi Ren;G. Zhou;G. Du;Honglan Xie;B. Deng;T. Xiao
X射线全场纳米计算机层析成像(Nano-CT)具有高空间分辨率的无损三维成像能力，已广泛应用于各个领域的形态和结构研究。传统的层析成像从大量等角度投影重建3D对象。对于纳米CT，由于投影量大，曝光时间长，采集时间长。为了克服或缓解这些困难，在上海同步辐射装置(SSRF)的X射线成像光束线上实现并构建了基于等斜率层析成像(EST)的纳米CT。初步结果表明，实现了空间分辨率为100 nm的硬TXM和具有三维纳米无损表征能力的EST基纳米CT。这项技术将SSRF的硬X射线成像能力提升到纳米级，并可能在包括纳米材料、新能源和生命科学在内的许多领域得到应用。该研究将有助于SSRF二期工程空间分辨率为20 nm的新型全场X射线纳米成像光束线的建设。
X-ray full-field nano-computed tomography (nano-CT) has non-destructive three-dimensional imaging capabilities with high spatial resolution, and has been widely applied to investigate morphology and structures in various areas. Conventional tomography reconstructs a 3D object from a large number of equal-angle projections. For nano-CT, it takes long collecting time due to the large projection numbers and long exposure time. Here, equally-sloped tomography (EST) based nano-CT was implemented and constructed on X-ray imaging beamline at the Shanghai Synchrotron Radiation Facility (SSRF) to overcome or alleviate these difficulties. Preliminary results show that hard TXM with the spatial resolution of 100 nm and the EST-based nano-CT with the ability of 3D nano non-destructive characterization have been realized. This technique promotes hard X-ray imaging capability to nano scales at SSRF and could have applications in many fields including nanomaterials, new energy and life sciences. The study will be helpful for the construction of the new full field X-ray nano-imaging beamline with the spatial resolution of 20 nm at SSRF phase II project.