Hard and soft x-ray photoemission spectroscopy study of the new Kondo system SmO thin film
Hard and soft x-ray photoemission spectroscopy study of the new Kondo system SmO thin film
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DOI:
10.1103/physrevmaterials.4.095001
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发表时间:
2020-04
期刊:
影响因子:
--
通讯作者:
S. Sakamoto;K. Kaminaga;D. Oka;R. Yukawa;M. Horio;Y. Yokoyama;Kohei Yamamoto;K. Takubo;Y. Nonaka-Y
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文献类型:
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作者:
S. Sakamoto;K. Kaminaga;D. Oka;R. Yukawa;M. Horio;Y. Yokoyama;Kohei Yamamoto;K. Takubo;Y. Nonaka-Y
SmO thin film is a new Kondo system showing a resistivity upturn around 10 K and was theoretically proposed to have a topologically nontrivial band structure. We have performed hard x-ray and soft x-ray photoemission spectroscopy to elucidate the electronic structure of SmO. From the Sm 3$d$ core-level spectra, we have estimated the valence of Sm to be $\sim$2.96, proving that the Sm has a mixed valence. The valence-band photoemission spectra exhibit a clear Fermi edge originating from the Sm 5$d$-derived band. The present finding is consistent with the theory suggesting a possible topological state in SmO and show that rare-earth monoxides or their heterostructures can be a new playground for the interplay of strong electron correlation and spin-orbit coupling.