FAR-INFRARED TIME-DOMAIN SPECTROSCOPY WITH TERAHERTZ BEAMS OF DIELECTRICS AND SEMICONDUCTORS
FAR-INFRARED TIME-DOMAIN SPECTROSCOPY WITH TERAHERTZ BEAMS OF DIELECTRICS AND SEMICONDUCTORS
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DOI:
10.1364/josab.7.002006
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发表时间:
1990-10-01
影响因子:
1.9
通讯作者:
FATTINGER, C
中科院分区:
文献类型:
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作者:
GRISCHKOWSKY, D;KEIDING, S;FATTINGER, C