Electric-Field Screening in Atomically Thin Layers of MoS2: the Role of Interlayer Coupling
Electric-Field Screening in Atomically Thin Layers of MoS2: the Role of Interlayer Coupling
复制标题
DOI：
10.1002/adma.201203731
复制
发表时间：
2013-02-13
影响因子：
29.4
通讯作者：
Rubio-Bollinger, Gabino
中科院分区：
文献类型：
--
作者：
Castellanos-Gomez, Andres;Cappelluti, Emmanuele;Rubio-Bollinger, Gabino
研究了单层和多层二硫化钼的静电筛分。静电力显微镜用于探测基片中电荷杂质产生的电场，并被MoS2片不完全屏蔽。采用非线性Thomas-Fermi理论解释实验结果，证明了层间耦合在二硫化钼筛选中的重要作用。
The electrostatic screening in single and few-layer MoS2 sheets is studied. Electrostatic force microscopy is used to probe the electric field generated by charge impurities in the substrate and incompletely screened by MoS2 sheets. A non-linear Thomas-Fermi theory is employed to interpret the experimental results, demonstrating the important role of the interlayer coupling in the screening of MoS2.