Measuring Thickness and Ultrasound Velocity of Thin Film by Means of Acoustic Resonant Spectroscopy
Measuring Thickness and Ultrasound Velocity of Thin Film by Means of Acoustic Resonant Spectroscopy
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声共振光谱测量薄膜厚度和超声速度
DOI:
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发表时间:
2016
期刊:
影响因子:
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通讯作者:
and I. Ihara
中科院分区:
文献类型:
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作者:
I. Matsuya;T. Saito;T. Kuwahara;M. Kondo;K. Ohnuma;and I. Ihara