Anisotropic magnetoresistance of ferromagnetic conductive filament in resistive switching memory
Anisotropic magnetoresistance of ferromagnetic conductive filament in resistive switching memory
复制标题
阻变存储器中铁磁导电丝的各向异性磁阻
DOI:
10.1149/06414.0029ecst
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发表时间:
2014
期刊:
影响因子:
--
通讯作者:
and S. Shingubara
中科院分区:
文献类型:
--
作者:
S. Otsuka;Y. Hamada;T. Shimizu;and S. Shingubara
We report on an origin of the conductive filament (CF) for a Ni/HfO2/Pt resistive switching memory. The device shows SET process (from high to low resistance), when positive bias is applied to the Ni electrode. RESET process (from low to high resistance) occurs during both positive and negative biases. We investigated the temperature dependence of resistance and magnetoresistance for the low resistance states (LRS) of the device, which were formed with different amount of a current compliance. LRS formed with the high current compliance has a linear temperature dependence of resistance compared with that formed with the low current compliance. Moreover, anisotropic magnetoresistance was observed for the LRS, which was formed with the high current compliance. This suggests that CF is made of the ferromagnetic Ni atoms when a high current compliance was used to form LRS.