Structure determination of multilayer silicene grown on Ag(111) films by electron diffraction: Evidence for Ag segregation at the surface
Structure determination of multilayer silicene grown on Ag(111) films by electron diffraction: Evidence for Ag segregation at the surface
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DOI：
10.1103/physrevb.89.241403
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发表时间：
2014-06
影响因子：
3.7
通讯作者：
Terufusa Shirai;T. Shirasawa;T. Hirahara;N. Fukui;Toshio Takahashi;S. Hasegawa
中科院分区：
文献类型：
--
作者：
Terufusa Shirai;T. Shirasawa;T. Hirahara;N. Fukui;Toshio Takahashi;S. Hasegawa
Terufusa Shirai,1 Tetsuroh Shirasawa,2,3 Toru Hirahara,1,* Naoya Fukui,1 Toshio Takahashi,2 和 Shuji Hasekawa1 1 东京大学物理系，7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan 2日本大学固体物理研究所 Tokyo, 5-1-5 Kashiwanoha, Kashiwa 277-8581, Japan 3JST, PRESTO, 4-1-8 Honcho Kawaguchi, Saitama, Japan（2014年5月2日收到；2014年5月28日收到修订稿；2014年6月10日出版）
Terufusa Shirai,1 Tetsuroh Shirasawa,2,3 Toru Hirahara,1,* Naoya Fukui,1 Toshio Takahashi,2 and Shuji Hasegawa1 1Department of Physics, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan 2Institute for Solid State Physics, University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa 277-8581, Japan 3JST, PRESTO, 4-1-8 Honcho Kawaguchi, Saitama, Japan (Received 2 May 2014; revised manuscript received 28 May 2014; published 10 June 2014)