Transport properties of ZnFe2O4−δ thin films
Transport properties of ZnFe2O4−δ thin films
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DOI：
10.1063/1.2751492
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发表时间：
2007-07
影响因子：
3.2
通讯作者：
A. Marcu;T. Yanagida;K. Nagashima;Hidekazu Tanaka;T. Kawai
中科院分区：
文献类型：
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作者：
A. Marcu;T. Yanagida;K. Nagashima;Hidekazu Tanaka;T. Kawai
本文通过改变氧分压和衬底温度，对ZnFe2O4−δ（ZFO）薄膜的输运性质进行了实验研究，以阐明环境气氛对输运性质的影响。先前的研究已经证明了由于氧空位导致的Fe 2+离子浓度对ZFO的输运性质的重要作用。我们的系统研究表明，ZFO薄膜的电输运也受到结构紊乱和空位的强烈影响。
This study presents an experimental investigation on the transport properties of ZnFe2O4−δ (ZFO) thin films to clarify the ambient atmosphere effects on the transport properties by varying the oxygen pressure and the substrate temperature. Previous investigations have demonstrated the significant role of Fe2+ ion concentration due to oxygen vacancies on the transport properties of ZFO. Our systematic investigation suggests that the electrical transport of ZFO thin films is also strongly influenced by structural disorders and vacancies.