Investigating the Intrinsic Noise Limit of Dayem Bridge NanoSQUIDs
Investigating the Intrinsic Noise Limit of Dayem Bridge NanoSQUIDs
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DOI:
10.1109/tasc.2014.2364920
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发表时间:
2015-06
影响因子:
1.8
通讯作者:
T. Patel;B. Li;J. Gallop;D. Cox;K. Kirkby;E. Romans;J. Chen;A. Nisbet;L. Hao
中科院分区:
文献类型:
--
作者:
T. Patel;B. Li;J. Gallop;D. Cox;K. Kirkby;E. Romans;J. Chen;A. Nisbet;L. Hao
NanoSQUIDs made from Nb thin films have been produced with nanometre loop sizes down to 200 nm, using weak-link junctions with dimensions less than 60 nm. These composite (W/Nb) single layer thin film devices, patterned by FIB milling, show extremely good low-noise performance ~170 nΦo at temperatures between 5 and 8.5 K and can operate in rather high magnetic fields (at least up to 1 T) . The devices produced so far have a limited operating temperature range, typically only 1-2 K. We have the goal of achieving operation at 4.2 K, to be compatible with the best SQUID series array (SSA) preamplifier available. Using the SSA to readout the nanoSQUIDs provides us with a means of investigating the intrinsic noise of the former. In this paper we report improved white noise levels of these nanoSQUIDs, enabling potential detection of a single electronic spin flip in a 1-Hz bandwidth. At low frequencies the noise performance is already limited by SSA preamplifier noise.