Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe.
Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe.
复制标题
DOI：
10.3762/bjnano.3.3
复制
发表时间：
2012
影响因子：
3.1
通讯作者：
Moriarty P
中科院分区：
文献类型：
--
作者：
Sweetman A;Jarvis S;Danza R;Moriarty P
背景：非接触式原子力显微镜(NC-AFM)现在可以在广泛的表面上有规律地产生原子分辨率的图像，并且已经展示了仅使用化学力操纵原子的能力。尽管如此，顶端在成像和操作中的作用仍然知之甚少，在实验和理论上都是一个活跃的研究领域。最近利用特殊功能的尖端的研究为阐明尖端尖端在观察到的对比中的作用提供了额外的动力。结果：利用非接触原子力显微镜(NC-AFM)的qPlus传感器，分析了在5K超高真空(UHV)中对Si(100)衬底进行成像时尖端尖端的影响。已经获得了一系列尖端尖端的稳定成像数据，每个尖端都有特征的成像特征。通过在接近零的外加偏压下成像，我们消除了隧道电流对针尖和表面之间作用力的影响，以及隧道电流诱导的硅二聚体激发，这是扫描探针研究硅(100)的关键问题。结论：在Si(100)表面上显示了一系列新的成像机制，这只能通过针尖尖端精确结构构型的变化来解释。这些图像为致力于开发用于NC-AFM模拟的真实针尖结构的理论家提供了宝贵的资源。力谱测量表明，尖端的终止对短程力和耗散能量都有重要影响。
Background: Noncontact atomic force microscopy (NC-AFM) now regularly produces atomic-resolution images on a wide range of surfaces, and has demonstrated the capability for atomic manipulation solely using chemical forces. Nonetheless, the role of the tip apex in both imaging and manipulation remains poorly understood and is an active area of research both experimentally and theoretically. Recent work employing specially functionalised tips has provided additional impetus to elucidating the role of the tip apex in the observed contrast. Results: We present an analysis of the influence of the tip apex during imaging of the Si(100) substrate in ultra-high vacuum (UHV) at 5 K using a qPlus sensor for noncontact atomic force microscopy (NC-AFM). Data demonstrating stable imaging with a range of tip apexes, each with a characteristic imaging signature, have been acquired. By imaging at close to zero applied bias we eliminate the influence of tunnel current on the force between tip and surface, and also the tunnel-current-induced excitation of silicon dimers, which is a key issue in scanning probe studies of Si(100). Conclusion: A wide range of novel imaging mechanisms are demonstrated on the Si(100) surface, which can only be explained by variations in the precise structural configuration at the apex of the tip. Such images provide a valuable resource for theoreticians working on the development of realistic tip structures for NC-AFM simulations. Force spectroscopy measurements show that the tip termination critically affects both the short-range force and dissipated energy.
登录
查看更多内容
影响因子：
56.9
作者：
Lantz, MA;Hug, HJ;Güntherodt, HJ
通讯作者：
Güntherodt, HJ
影响因子：
8.6
作者：
Sweetman, Adam;Jarvis, Sam;Moriarty, Philip
通讯作者：
Moriarty, Philip
影响因子：
56.9
作者：
Gross, Leo;Mohn, Fabian;Meyer, Gerhard
通讯作者：
Meyer, Gerhard
影响因子：
3.7
作者：
Rahe, P.;Bechstein, R.;Kuehnle, A.
通讯作者：
Kuehnle, A.
影响因子：
3.7
作者：
Sugimoto, Yoshiaki;Pou, Pablo;Abe, Masayuki
通讯作者：
Abe, Masayuki