Depth profiling of surface degradation of silicone rubber composite insulators by remote laser-induced breakdown spectroscopy
Depth profiling of surface degradation of silicone rubber composite insulators by remote laser-induced breakdown spectroscopy
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DOI：
10.1016/j.sab.2021.106206
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发表时间：
2021-04
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影响因子：
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通讯作者：
Taisei Homma;A. Kumada;T. Fujii;H. Homma;Y. Oishi
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作者：
Taisei Homma;A. Kumada;T. Fujii;H. Homma;Y. Oishi
高压硅橡胶复合绝缘子广泛应用于输电线路的室外绝缘。硅橡胶是一种壳体材料，长期在现场使用，会逐渐降解。因此，为了准确地确定合成绝缘子的寿命，评估这种劣化是必不可少的。本文描述了利用激光诱导击穿光谱(LIBS)进行深度剖析的结果，它显示了退化引起的化学成分的变化。构建了一个用于现场降级诊断的远程LIBS系统。用距离为10的二次谐波激光脉冲照射电场老化的绝缘子，用望远镜接收等离子体辐射，并进行光谱分析。用能量色散X射线能谱(EDX)进行了对比研究。形成三水氧化铝填料的有机硅与铝的发射强度比在降解表面比未降解的块体降低了约30%。LIBS和EDX测量证实，降解表面的有机硅减少到300层。这些结果表明，以硅铝比为指标的远程LIBS是一种很有前途的合成绝缘子现场诊断方法。
High-voltage silicone rubber composite insulators are widely used for outdoor insulation in power transmission lines. Silicone rubber, which is used as a housing material, gradually degrades with long-term use in the field. Therefore, to accurately determine the lifetime of composite insulators, it is essential to evaluate this degradation. This paper describes the results of depth profiling, which shows the change in the chemical composition caused by degradation, using laser-induced breakdown spectroscopy (LIBS). A remote LIBS system was constructed for application inin-situdegradation diagnostics. Field-aged insulators were irradiated with second harmonic Nd:YAG laser pulses at a distance of 10. The emission from the plasma was received by a telescope, and a spectroscopic analysis was performed. Energy dispersive X-ray spectroscopy (EDX) was performed for a comparative study. The emission intensity ratio of silicone to aluminum, which forms an alumina trihydrate filler, decreased by approximately 30% at the degraded surface compared to the undegraded bulk. A reduction in silicones at the degraded surface up to a depth of 300 was confirmed by LIBS and EDX measurements. These results show that remote LIBS using the ratio of silicone to aluminum as an index is a promising method for thein-situdiagnostics of composite insulators.