Quadrature wavelength scanning interferometry.
Quadrature wavelength scanning interferometry.
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DOI：
10.1364/ao.55.005332
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发表时间：
2016-07
期刊：
影响因子：
1.9
通讯作者：
G. Moschetti;A. Forbes;R. Leach;Xiang Jiang;Daniel O’Connor
中科院分区：
文献类型：
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作者：
G. Moschetti;A. Forbes;R. Leach;Xiang Jiang;Daniel O’Connor
描述了一种将波长扫描干涉仪 (WSI) 测量范围加倍的新方法。在 WSI 中，测量的光程差 (OPD) 受到符号模糊的影响，也就是说，无法从干涉信号中区分 OPD 是正还是负。可以通过测量正交干扰信号来解决符号模糊性。描述了一种获取 WSI 正交干扰信号的方法，并报告了其优点的理论分析。讨论了该技术的优点以及非理想正交引起的信号误差的仿真。分析和模拟得到实验测量的支持，以显示性能的改进。
A novel method to double the measurement range of wavelength scanning interferometery (WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign ambiguity, that is, from an interference signal it is not possible to distinguish whether the OPD is positive or negative. The sign ambiguity can be resolved by measuring an interference signal in quadrature. A method to obtain a quadrature interference signal for WSI is described, and a theoretical analysis of the advantages is reported. Simulations of the advantages of the technique and of signal errors due to nonideal quadrature are discussed. The analysis and simulation are supported by experimental measurements to show the improved performances.