Detection of an evanescent field scattered by silicon tips in an apertureless scanning near-field optical microscope
Detection of an evanescent field scattered by silicon tips in an apertureless scanning near-field optical microscope
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在无孔径扫描近场光学显微镜中检测硅尖端散射的渐逝场
DOI：
10.1051/epjap:1999168
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发表时间：
1999
期刊：
影响因子：
--
通讯作者：
P. Royer
中科院分区：
文献类型：
--
作者：
R. Laddada;S. Benrezzak;P. Adam;G. Viardot;J. Bijeon;P. Royer
我们描述了如何商业硅悬臂梁可以用作力探针和本地光散射。该针尖可作为无孔径扫描近场光学显微镜（SNOM）与原子力显微镜（AFM）结合的关键元件。我们使用全内反射（TIR）照明，以提供具有明确定义的特性的菲涅耳倏逝波。我们展示了如何从近场散射的尖端发出的微弱信号可以从背景噪声中提取。最后，我们提出了如何也可以得到一个信号的近场时，尖端振荡的频率接近的悬臂梁的谐振频率。这些结果进行了比较与模拟的锁定检测。最后我们描述了振动幅度对信号的作用。
We describe how a commercial silicon cantilever can be used both as a force probe and a local scatterer of light. This tip can thus be used as the key element of an apertureless Scanning Near-field Optical Microscope (SNOM) combined with an Atomic Force Microscope (AFM). We use a Total Internal Reflection (TIR) illumination to provide a Fresnel evanescent wave with well-defined characteristics. We show how the weak signal issued from the near-field scattered by the tip can be extracted from the background noise. Finally we present how a signal related to the near field can also be obtained when the tip is oscillated at a frequency close to the resonance frequency of the cantilever. These results are compared with a simulation of the lock-in detection. Finally we describe the role of the vibration amplitude on the signal.