Atomic structure of [0001]-tilt grain boundaries in ZnO: A high-resolution TEM study of fiber-textured thin films
Atomic structure of [0001]-tilt grain boundaries in ZnO: A high-resolution TEM study of fiber-textured thin films
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DOI:
10.1103/physrevb.70.125415
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发表时间:
2004-09
影响因子:
3.7
通讯作者:
F. Oba;H. Ohta;Y. Sato;H. Hosono;Takahisa Yamamoto;Y. Ikuhara
中科院分区:
文献类型:
--
作者:
F. Oba;H. Ohta;Y. Sato;H. Hosono;Takahisa Yamamoto;Y. Ikuhara
The atomic structure of [0001]-tilt grain boundaries in ZnO was investigated using high-resolution transmission electron microscopy (HRTEM) and atomistic calculations. HRTEM observation was conducted for [0001] fiber-textured ZnO thin films grown on quartz-glass substrates by the pulsed-laser deposition. The [0001]-tilt boundaries observed in the films can be classified into three types: low-angle boundaries composed of irregular dislocation arrays, boundaries with ${10\overline{1}0}$ facet structures, and near-low $\ensuremath{\Sigma}$ boundaries represented by symmetric periodicity units. The atomic structure of the boundaries is discussed with a focus on a $\ensuremath{\Sigma}=7$ boundary in conjunction with atomistic calculations and HRTEM image simulations. The $\ensuremath{\Sigma}=7$ boundary consists of multiple structural units that are very similar to the core structures of edge dislocations. Straight or zigzag arrangements of the dislocationlike structural units constitute other high-angle boundaries with symmetric and ${10\overline{1}0}$ facet structures as well. It is suggested that [0001]-tilt boundaries in ZnO are generally described as an array of the dislocationlike units.