Photonic Force Microscopy: simulation of principles and applications
Photonic Force Microscopy: simulation of principles and applications
复制标题
光子力显微镜：原理和应用的模拟
DOI：
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发表时间：
2001
期刊：
影响因子：
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通讯作者：
E. Stelzer
中科院分区：
文献类型：
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作者：
A. Rohrbach;E. Florin;E. Stelzer
光子力显微镜是一种新型扫描探针显微镜，基于光镊来固定探针，探针的位置会因热噪声而波动。通过分析非散射光和前向散射光的干涉，以高时间分辨率和空间精度检测探头的三维位置。我们提出了作用在探头上的光学力以及相干散射引起的检测信号的理论框架，并通过布朗动力学模拟描述了热噪声位置波动。作为一种应用，我们模拟了在不同激光功率和不同锚定位置下拴在盖玻片上的探针（根据分子驱动蛋白/微管系统）的时间和空间行为。
The Photonic Force Microscope is a novel scanning probe microscope based on optical tweezers to hold a probe, which fluctuates in its position due to thermal noise. The three-dimensional position of the probe is detected with high temporal resolution and spatial precision by analyzing the interference of unscattered and forward scattered light. We present the theoretical framework of the optical forces acting on the probe, as well as of the detection signal due to coherent scattering and describe thermal noise position fluctuations by a Brownian dynamics simulation. As an application we simulate the temporal and spatial behavior of a probe tethered to the coverslip (according to the molecular kinesin/microtubule system) at different laser powers and different anchor positions.