An Evaluation of An Ultralow Background Alpha-Particle Detector

An Evaluation of An Ultralow Background Alpha-Particle Detector
复制标题

DOI:
10.1109/tns.2009.2034001
复制
发表时间:
2009-12
影响因子:
1.8
通讯作者:
Michael S. Gordon;D. Heidel;K. Rodbell;B. Dwyer-McNally;William K. Warburton
Michael S. Gordon;D. Heidel;K. Rodbell;B. Dwyer-McNally;William K. Warburton
中科院分区:
工程技术3区
文献类型:
--
作者:
Michael S. Gordon;D. Heidel;K. Rodbell;B. Dwyer-McNally;William K. Warburton

文献摘要

被引文献

相似文献

夏为IBM提供了一个用于评估的超低本底阿尔法粒子计数器原型。结果显示,与其他商业计数器相比,背景显著减少,允许快速测量低发射率材料。
XIA has provided IBM with a prototype ultralow background alpha particle counter for evaluation. Results show a significant decrease in background compared to other commercial counters allowing for rapid measurement of low-emissivity materials.