Ring oscillator based technique for measuring variability statistics
Ring oscillator based technique for measuring variability statistics
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基于环形振荡器的技术，用于测量变异性统计数据
DOI：
10.1109/icmts.2006.1614281
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发表时间：
2006
期刊：
影响因子：
--
通讯作者：
A. Gattiker
中科院分区：
文献类型：
--
作者：
M. Bhushan;M. Ketchen;S. Polonsky;A. Gattiker
通过将输出频率顺序地组合成具有由标准频率计数器读出的统计频率参数的单频调制信号，来测量名义上相同的密集环形振荡器阵列中的器件参数引起的频率变化。对于这里描述的例子，环形振荡器被设计成捕捉MOSFET阈值电压的随机变化。
Device parameter induced frequency variations in a dense array of nominally identical ring oscillators are measured by sequentially combining the output frequencies into a single frequency modulated signal with the statistical frequency parameters read out by a standard frequency counter. For the example described here, the ring oscillators are designed to capture random variations in MOSFET threshold voltages.