Approaches for reliability modeling of continuous-state devices
Approaches for reliability modeling of continuous-state devices
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DOI：
10.1109/24.765922
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发表时间：
1999-03
影响因子：
5.9
通讯作者：
M. Zuo;R. Jiang;R. Yam
中科院分区：
文献类型：
--
作者：
M. Zuo;R. Jiang;R. Yam
本文提出了连续状态设备可靠性建模的三种方法。一种是使用随机过程来拟合作为时间函数的统计分布的模型参数。这种方法允许数据集来自任何一般分布。第二种方法使用一般路径模型来拟合作为时间函数的模型参数。阐明了随机过程模型与一般路径模型的关系。第三种方法采用多元线性回归直接拟合寿命分布。该方法对待分析的降解数据的限制较少。所有这三种方法都用实例加以说明。最后，提出了一种混合模型，它可以用来模拟灾难性故障和退化故障。该混合模型还向工程师展示了如何设计实验来收集硬故障数据和软故障数据。在连续设备可靠性建模的进一步调查的主题包括进一步调查的混合物模型，这些模型的实际应用情况，并使用复杂的统计分布，以适应退化数据。
Three approaches for reliability modelling of continuous state devices are presented in this paper. One uses the random process to fit model parameters of a statistical distribution as functions of time. This approach allows the data set to be from any general distribution. The second approach uses the general path model to fit parameters of the model as functions of time. The relationship between the random process model and the general path model is illustrated. The third approach uses multiple linear regression to fit the distribution of lifetime directly. This approach has less restriction on the degradation data to be analyzed. All three approaches are illustrated with examples. Finally a mixture model is proposed which can be used to model both catastrophic failures and degradation failures. This mixture model also shows engineers how to design experiments to collect both hard failure data and soft failure data. Topics for further investigation in continuous device reliability modelling include further investigation of the mixture model, application of these models to practical situations, and using complex statistical distributions to fit degradation data.